Comparison ledger
ABM -407B-2-S-CE-S293 Robot, Keysight 4156 C Precision Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | ABM | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | ABM -407B-2-S-CE-S293 Robot | Keysight 4156 C Precision Semiconductor Parameter Analyzer |
| Cited variants | — | |
| Specifications | ||
| Model | ABM-407B-2-S-CE-S293[2] | 4156 C[3] |
| Description | ROBOT[2] | — |
| Refurbished RTP RTA | AG Associates 4100, 4108, 8108, 8800, 8800i,210, 310, 410, 610, 610I, MPT RTP-600S, 800S, RTP-3000[2] | — |
| KLA-Tencor Spare Parts and Service | RS-35C,RS-55,RS-75,RS-100,UV-1050,UV-1080,UV-1250,UV-1280,ASET F5 / F5X,AIT Systems,HRP-220 Stylus Profiler[2] | — |
| Refurbished Isotropic Plasma Etcher | Matrix, Tegal, Lam Research, Branson/IPC, PlasmaTherm[2] | — |
| Refurbished PECVD, ALD Equipment | Cambridge, Oxford PlasmaLab , Plasma-Therm, STS/SPTS, AMAT[2] | — |
| Refurbished Mask Aligner | Canon Neutronix PLA501/545, Suss MA200CC, MA8BA8 GEN3, MA8BA8 GEN2, MA8BA8, MA200E[2] | — |
| Refurbished Bonding | SUSS SB6E, SUSS SB8E, EVG 620 BA, EVG EV501, West Bond 7200AR 7400A[2] | — |
| Refurbished Wafer Prober | Electroglas EG 4090u+, EG 4090, EG 2001X, EG 1034X, Cascade PS-21[2] | — |
| Make | — | Keysight / Agilent[3] |
| Measurement modes | — | DC, pulsed force/measure, stress force, voltage/current sweep, and sampling (time domain) measurements[1] |
| Sweep types | — | linear or logarithmic; VAR1 primary sweep, VAR2 subordinate sweep, and VAR1' synchronous sweep[1] |
| Sampling modes | — | linear, log, and thinned-out[1] |
| Maximum sampling points | — | 10,001 (linear)[1] |
| Stress time set range | — | 500 μs to 31,536,000 s (365 days)[1] |
| Desktop software | — | Desktop EasyEXPERT standard edition[1] |
| model | — | 4156 C Precision Semiconductor Parameter Analyzer[3] |
| device type | — | precision semiconductor parameter analyzer[3] |
| measurement types | — | DC and quasi-static measurements[1] |
| sweep measurement types | — | basic sweep, subordinate sweep, synchronous sweep, and pulse sweep[4] |
| sampling measurement modes | — | linear, log, and thinned-out[1] |
| measurement units | — | SMU, VSU, VMU, PGU, and GNDU[1] |