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HP / Verigy PS 3600 Pinscale alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
LTX-Credence
ASL 1000
Test & Probe
The LTX / Credence ASL 1000 is an integrated-circuit tester commonly configured with an Electroglas EG 4090 prober for 8-inch wafers.
LTX-Credence
ASL 3000
Test & Probe
The LTX / Credence ASL 3000 is a semiconductor tester with a computer configuration including a Pentium 4 processor, 1GB RAM, 80GB HDD, and Windows NT 4.0 operating system.
Teradyne
J 750
Test & Probe
Teradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.
Teradyne
Ultra Flex SC
Test & Probe
The Teradyne Ultra Flex SC is a semiconductor test system used for test and probe applications.
Applied Materials
0720 06060 Part
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
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