Comparison ledger
Advantest T 5501, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5501Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5501 | KLA 1007 |
| Specifications | ||
| Configuration | parts machine[1] | — |
| Test target devices | GDDR3/4-SDRAM, SRAM, DDR3-SDRAM, etc.[2] | — |
| Maximum number of devices per system | 32[2] | — |
| Maximum test rate | 1.066 GHz / 2.133 GHz (DDR mode)[2] | — |
| Maximum test rate (single-edge) | 1.066 GHz[2] | — |
| Maximum test rate (DDR mode) | 2.133 GHz[2] | — |
| Supported memory types | GDDR3/4-SDRAM, SRAM, DDR3-SDRAM[2] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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