Comparison ledger
Agilent 6460 C, Applied Materials 0010-13627 High Efficiency RF Match, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 6460 CAgilent | 0010-13627 High Efficiency RF MatchApplied Materials |
|---|---|---|
| OEM | Agilent | Applied Materials |
| Category | Lab & Support Equipment | Lab & Support Equipment |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 64xx | Applied Materials 0010-13627 High Efficiency RF Match |
| Specifications | ||
| Configuration | with Agilent 1260 LC[1] | HE, BIAS[4] |
| Instrument type | Triple quadrupole LC-MS/MS[2] | — |
| Analyzer type | Triple quadrupole[2] | — |
| Mass range | m/z 5-3,000[2] | — |
| Maximum scan rate | 12,500 Da/s[2] | — |
| Polarity switching | 30 ms[2] | — |
| Resolution | 0.7 Da FWHM with autotune; 0.5 Da FWHM with manual tuning[2] | — |
| Mass accuracy | 0.1 Da from m/z 5-1,000; 0.01% from m/z 1,000-2,000; 0.02% from m/z 2,000-3,000[2] | — |
| Mass stability | Less than 0.1 Da over 24 hours[2] | — |
| Minimum MRM dwell time | 1 ms[2] | — |
| Acquisition modes | MS scan, SIM, MRM, product-ion scan, precursor-ion scan and neutral-loss/gain scan[2] | — |
| Configuration option | With Agilent 1260 LC[3] | — |
| Asset Number | — | 70430[4] |
| Type | — | High Efficiency RF Match - HE, BIAS[4] |
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