Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, Zygo 7300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | 7300Zygo |
|---|---|---|
| OEM | Applied Materials | Zygo |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | Zygo 7300 |
| Cited variants | — |
|
| Specifications | ||
| Make | Applied Materials[2] | Zygo[5] |
| Model | 0010-22161[2] | 7300[5] |
| Description | HTESC PH 1 REV A[3] | — |
| Condition | Used[3] | — |
| Stock Number | BM6628[3] | — |
| Scan Speed | — | ≤135 µm/sec[4] |
| System Zoom | — | Auto; multi (3 pos)[4] |
| Max Scan Range | — | ≤20 mm[4] |
| Objectives | — | From 1X to 100X[4] |
| Max Field of View | — | 14 mm standard; 22 mm optional (with megapixel camera)[4] |
| Turret Options | — | Motorized or Manual (6 Position)[4] |
| Z Stage | — | Motorized (100 mm travel)[4] |
| X-Y Stages | — | Manual (100 mm travel) or Motorized (150 mm travel)[4] |
| Tip/Tilt Stage | — | Manual or Motorized[4] |
| Encoded Z, X-Y Stage | — | Yes (optional)[4] |
| Measurement Principle | — | Scanning white light interferometry (SWLI)[4] |
| Height Resolution | — | 0.1 nm[4] |
| Category | — | Laboratory Equipment[6] |
| Type | — | 3D optical surface profiler / profilometer[1] |
| Measurement principle | — | Scanning white light interferometry[1] |
| Measurement method | — | Scanning white light interferometry (SWLI)[4] |