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Comparison ledger

0020 17485 Partversus635LL

Applied Materials 0020 17485 Part, Denton Vacuum 635LL, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0020 17485 PartApplied Materials
635LLDenton Vacuum
OEMApplied MaterialsDenton Vacuum
CategoryDepositionDeposition
Wafer size—200mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0020 17485 PartDenton Vacuum 635LL
Specifications
ConfigurationStrap, RF Out 2 Balanced Coil Match, Hdp[1]—
Cathodes—4-cathodes[2]
Gas / process feedback—RGA, OES-feedback reactive oxygen or nitrogen sputter[2]
Chuck temperature—heated/cooled chuck to 500C[2]
Process mode—co-sputtering[2]
Substrate size—coats up to 200mm diameter substrates[2]
Number of cathodes—4[3]
Residual gas analysis (RGA)—Included[3]
Reactive sputtering feedback—OES-feedback reactive oxygen or nitrogen sputter[3]
Chuck temperature range—Heated/cooled to 500 °C[3]
Co-sputtering capability—Yes[3]
Maximum substrate size—200 mm diameter[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]nanofab.utah.edunanofab.utah.edu
  3. [3]nanofab.utah.edunanofab.utah.edu