Comparison ledger
Applied Materials 0720 06060 Part, Cascade Microtech 300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | 300Cascade Microtech |
|---|---|---|
| OEM | Applied Materials | Cascade Microtech |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | 300mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Cascade Microtech 300 |
| Cited variants | — | |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[2] | — |
| Wafer size | — | ≤ 300 mm[1] |
| CM300 description | — | Flexible on-wafer probe system[1] |
| Control software | — | Velox™ probe station control software[1] |
| Automation/features | — | Safe and fast wafer loading and easy test automation and measurement[1] |
| Application | — | On-wafer test[1] |
| Position in product line | — | 300 mm probing solutions[1] |
| Positioning | — | precision and versatility[1] |
| Testing scope | — | a wide range of advanced, complex testing requirements[3] |
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