Waferpedia

Comparison ledger

0720 06060 PartversusDiamondX

Applied Materials 0720 06060 Part, LTX-Credence DiamondX, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
DiamondXLTX-Credence
OEMApplied MaterialsLTX-Credence
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartLTX-Credence DiamondX
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[1]50/60 Hz[2]
Category—Test & Probe[3]
Description—ATE[4]
Test head—20 slot[2]
Power—50/60 Hz[2]
Current—50A[2]
Power distribution unit—400 VAC nominal[2]
Digital vector option—GX1x Digital 192ch 50MHz vector rate 18M Vect[2]
Precision V/I source—VIS16 16ch[2]
Utility board—SDU System & DUT Utility Board[2]
Scan option—DPIN96[2]
DSP send/receive option—DPIN96 DSP Send/Receive option[2]
Monitor—Standard 22 inch LCD monitor[2]
Handler interface—Parallel/TTL handler interface card for CPU[2]
Noise reduction—Exhaust baffle for audible noise reduction[2]
Emergency stop—Remote emergency shutdown button (EMO)[2]
Multimeter—3446 1/2 digit multimeter, external[2]
System interface—Systems Test Interface[2]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing
  3. [3]waferpedia.comwaferpedia.com
  4. [4]semi-sps.comsemi-sps.com