Comparison ledger
Cohu Matrix II DM 8888, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | Cohu | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cohu Matrix II DM 8888 | KLA 1007 |
| Specifications | ||
| Configuration | JEDEC Tray[1] | — |
| Tri-Temperature test range | -40 ~175*C with LN2[1] | — |
| Temperature control range | -55*C to +175*C[1] | — |
| Air (CDA) System | 0.414 to 0.69 MPa, 566 L/min, -10*C[1] | — |
| Air (CDA), Thermal purge | 0.414 to 0.69 MPa, 340 L/min, -70*C[1] | — |
| LN2 | 0.276 to 0.483 MPa, 0.88 L/min +15% at -55*C[1] | — |
| Operating system | Windows XP[1] | — |
| Power supply | 200-240 VAC, 12.5 kVA, 3 Phase, 50/60 Hz, 30 A[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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