Comparison ledger
KLA .498 PSL Wafer, Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Scientific FEI Tecnai G 2 F 20 X-Twin TEMThermo Fisher | |
|---|---|---|
| OEM | KLA | Thermo Fisher |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Thermo Fisher Scientific FEI Tecnai G 2 F 20 X-Twin TEM |
| Specifications | ||
| Configuration | NIST Traceable[1] | Fischione M3000 HAADF[2] |
| NIST traceability | Yes[1] | — |
| Camera | — | Orius SC 1000, model 832[2] |
| Software version | — | 4.2[2] |
| Spot drift | — | 0.424 nm/min[2] |
| FEG probe current | — | 0.923 nA[2] |
| Specimen drift | — | < 0.5 nm/min[2] |
| Resolution TEM point | — | < 0.26 nm[2] |
| Resolution TEM line | — | 0.102 nm[2] |
| Information limit | — | < 0.14 nm[2] |
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