Waferpedia

Comparison ledger

Archer 10 XT OverlayversusDektak

KLA Archer 10 XT Overlay, Veeco Dektak, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
DektakVeeco
OEMKLAVeeco
CategoryMetrology & InspectionMetrology & Inspection
Wafer size200mm200mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA ArcherVeeco Dektak
Specifications
ConfigurationDuring refurbishment the loadports were replaced with the cassette loader that is shown in our video below[1]—
Wafer size200mm dual port open wafer handler[1]—
OEMKLA[2]—
ModelArcher 10 XT Overlay[2]DEKTAK 150[3]
CategoryMetrology & Inspection[2]—
Description200mm overlay metrology system[2]—
Software version5.6[1]—
Wafer handler200mm dual port open wafer handler[1]—
Chuck8" chuck[1]—
Computer upgradeXP computer upgrade[1]—
ComputerKLASS RS2 computer[1]—
Manufacturer—Veeco[3]
Purpose—Stylus-based scanning system for measuring surface topography and thin film step heights[4]
Tip Size—12 µm[3]
Standard Stylus Tip—2.5 μm[4]
Scan Length—55 - 200 mm[3]
Maximum Data Points per Scan—120,000[3]
Maximum Sample Size—200 mm[3]
Sample Diameter—up to 200 mm in diameter[4]
Sample Thickness—up to 90 mm thick[4]
Stylus Force—1 - 15 mg[3]
X-Y Translation—101.6 x 101.6 mm[4]
Stage Type—Two-axis, manual sample-positioning stage[4]
Stage Leveling and Rotation—Manual stage leveling and rotation[4]
Leveling—Two-point programmable or cursor software leveling[4]
Environmental Enclosure—Acrylic environmental enclosure[4]
Maximum sample thickness—90 mm[4]
X-Y translation range—101.6 x 101.6 mm[4]
Long scan length—55 mm[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]egr.vcu.eduegr.vcu.edu
  4. [4]uwaterloo.cauwaterloo.ca