Thermo Fisher
Scientific FEI Quanta 450 FEG alternatives
Comparable Metrology & Inspection equipment documented in the Waferpedia catalog.
6 comparable tools
Hitachi
S 9300
Metrology & Inspection
The Hitachi S 9300 is a scanning electron microscope (SEM) used for metrology and inspection, with a year of manufacture of 09-1999.
Zeiss
Sigma HDVP
Metrology & Inspection
The Zeiss Sigma HDVP is a scanning electron microscope with an acceleration voltage of 0.02 kV to 30 kV and a magnification range of 10x to 1,000,000x.
Hitachi
TM 3030 Tabletop
Metrology & Inspection
The Hitachi TM3030 is a compact tabletop scanning electron microscope (SEM) designed for high-magnification imaging of various samples with minimal preparation.
KLA
.204 PSL Wafer
Metrology & Inspection
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA
.496 PSL Wafer
Metrology & Inspection
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
KLA
.498 PSL Wafer
Metrology & Inspection
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
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