Comparison ledger
Advantest T 6371, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 6371Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 6371 | KLA 1007 |
| Cited variants | — | |
| Specifications | ||
| Phase | 3 Phase / 4 Wire[2] | — |
| Configuration | 200/208 Vac[2] | — |
| TC_UNIT | TC7[2] | — |
| TH1 I/O | 256Ch[2] | — |
| LCD | 768Ch[2] | — |
| PPS 20V | 8Ch[2] | — |
| PPS40V | 8Ch[2] | — |
| RVS | 32Ch[2] | — |
| Power | 3 Phase / 4 Wire - 200/208 Vac - 50/60 Hz[2] | — |
| System | TC_UNIT: TC7 - 125/250MHz[2] | — |
| I/O channels | TH1 I/O : 256Ch[2] | — |
| Per Pin Power Supply (PPS) 20V | 8Ch[2] | — |
| Per Pin Power Supply (PPS) 40V | 8Ch[2] | — |
| Analog driver pins (maximum) | 1280 pins[1] | — |
| Digital driver pins (maximum) | 256 pins[1] | — |
| Maximum test frequency | 125/250MHz[1] | — |
| Software | Viewpoint LCD[1] | — |
| OEM | Advantest[2] | — |
| Model | T 6371[2] | 1007[4] |
| Equipment type | Tester[2] | Prober[5] |
| System type | LCD driver test system[1] | — |
| Target devices | LCD driver IC, MCU, MPU[1] | — |
| Maximum number of measuring devices | 4[1] | — |
| Maximum frequency | 125/250MHz[1] | — |
| Manufacturer | — | KLA[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
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