Comparison ledger
Agilent Medalist i 5000 ICT, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Medalist i 5000 ICTAgilent | 1007KLA |
|---|---|---|
| OEM | Agilent | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent Medalist i 5000 ICT | KLA 1007 |
| Specifications | ||
| Test Head | N 1141 A[1] | — |
| Config | ATO 46121[1] | — |
| Test Head Assembly | N1145 A[1] | — |
| 2 x Ctl_Xtp control cards | throughput multiplier capable[1] | — |
| 64 MB RAM per module | probe location and debug of Module 3[1] | — |
| 8 programmable channels | 2 x Agilent 6624, four channels in each Modul 3 & 3[1] | — |
| Frequency | 50 Hz (configured for European mains)[1] | — |
| No board handler | standalone system, manual board load[1] | — |
| Architecture | Un-multiplexed, tester per pin, 1:1 channel to node[1] | — |
| Board Configuration | 18 x Unmex_H 144 Channel hybrid pin cards: 2,592 un-multiplexed nodes[1] | — |
| Analogue Stimulus/Response | 2 x ASRU_C analogue stimulus/response units, one per module[1] | — |
| Control Cards | 2 x Ctl_Xtp control cards: throughput multiplier capable[1] | — |
| Memory | 64 MB RAM per module[1] | — |
| Power Supplies | 8 programmable channels: 2 x Agilent 6624, four channels in each module[1] | — |
| Mains Frequency | 50 Hz (configured for European mains)[1] | — |
| Configuration | No board handler: standalone system, manual board load[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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