Comparison ledger
Applied Materials 0010-03254 E Chuck, Bruker Dektak 3030, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03254 E ChuckApplied Materials | Dektak 3030Bruker |
|---|---|---|
| OEM | Applied Materials | Bruker |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | Bruker Dektak 3030 |
| Specifications | ||
| Manufacturer | — | Bruker / Veeco[1] |
| Model | — | Dektak 3030[1] |
| Wafer size | — | 8 inch[1] |
| Vertical range | — | 100 angstroms(A) to 1,310KA[2] |
| Vertical resolution | — | 1A/65KA, 20A/1,310KA[2] |
| Scan length range | — | 50 microns to 50mm[2] |
| Scan speed ranges | — | Low, medium, high[2] |
| Software leveling | — | 2-point programmable or cursor leveling[2] |
| Stage leveling | — | Manual[2] |
| Stylus force | — | 1mg to 40mg[2] |
| Maximum sample thickness | — | 45mm(1.5")[2] |
| Sample stage diameter | — | 165mm[2] |
| Zoom magnification | — | 60X to 420X[2] |
| Motorized zoom camera | — | Solid state monochrome image[2] |