Waferpedia

Comparison ledger

0720 06060 Partversus103-754

Applied Materials 0720 06060 Part, Cascade Microtech 103-754, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
103-754Cascade Microtech
OEMApplied MaterialsCascade Microtech
CategoryTest & ProbeTest & Probe
Wafer size—6-inch diameter microchamber and thermal chuck
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartCascade Microtech 103-754
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[1]—
type—x-y-z-θ probe positioner[2]
installed on—HFTL 50-GHz Small-Signal Probe Station[2]
quantity in station—two[2]
station chuck size—6-inch-diameter microchamber and thermal chuck[2]
Quantity per station—Two positioners[2]
Chuck size—6-inch-diameter microchamber and thermal chuck[2]
Temperature range—-50 to 200 °C[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]cnf.cornell.educnf.cornell.edu