Waferpedia

Comparison ledger

0720 06060 PartversusEHS-222MD

Applied Materials 0720 06060 Part, Espec EHS-222MD, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
OEMApplied MaterialsEspec
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartEspec EHS-222MD
Cited variants—
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[2]—
Type—Highly accelerated stress test system (HAST chamber)[1]
Model—EHS-222MD[1]
Chamber configuration—2-stage[1]
Interior dimensions—φ394×L426 mm[1]
Temperature / humidity / pressure range—+105.0℃ to +142.9℃ / 75%rh to 100%rh / 0.019 to 0.193 MPa (Gauge)[1]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]espec.co.jpespec.co.jp
  2. [2]inventory listing