Comparison ledger
Cascade Microtech 103-754, Cascade Microtech 300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 103-754Cascade Microtech | 300Cascade Microtech |
|---|---|---|
| OEM | Cascade Microtech | Cascade Microtech |
| Category | Test & Probe | Test & Probe |
| Wafer size | 6-inch diameter microchamber and thermal chuck | 300mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech 103-754 | Cascade Microtech 300 |
| Cited variants | — | |
| Specifications | ||
| type | x-y-z-θ probe positioner[2] | — |
| installed on | HFTL 50-GHz Small-Signal Probe Station[2] | — |
| quantity in station | two[2] | — |
| station chuck size | 6-inch-diameter microchamber and thermal chuck[2] | — |
| Quantity per station | Two positioners[2] | — |
| Chuck size | 6-inch-diameter microchamber and thermal chuck[2] | — |
| Temperature range | -50 to 200 °C[2] | — |
| Wafer size | — | ≤ 300 mm[1] |
| CM300 description | — | Flexible on-wafer probe system[1] |
| Control software | — | Velox™ probe station control software[1] |
| Automation/features | — | Safe and fast wafer loading and easy test automation and measurement[1] |
| Application | — | On-wafer test[1] |
| Position in product line | — | 300 mm probing solutions[1] |
| Positioning | — | precision and versatility[1] |
| Testing scope | — | a wide range of advanced, complex testing requirements[3] |
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