Comparison ledger
Cohu Eclipse, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EclipseCohu | 1007KLA |
|---|---|---|
| OEM | Cohu | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cohu Eclipse | KLA 1007 |
| Specifications | ||
| Configuration | With T 5832 ES Tester (P/N E908/79)[1] | — |
| Model | Eclipse[1] | 1007[2] |
| Make | Cohu[1] | KLA[3] |
| Equipment type | Handler[1] | Prober[3] |
| Tester configuration | With T 5832 ES Tester (P/N E908/79)[1] | — |
| Power | 200-240 V[1] | — |
| Frequency | 50/60 Hz[1] | — |
| Included test head | Advantest T 5832 ES Test Head (2021 Vintage)[1] | — |
| Included manipulator | Intest EMS Cobal 25 AVT 5832 ES / DUT UP Test Head Manipulator, P/N: 930905 C (2021 Vintage)[1] | — |
| Included chiller | OptiTemp UA 000670 AA Recirculating Chiller, ref R 449 A R 508 B (2021 Vintage)[1] | — |
| Included fixture | DGAC DDECLIPSE / AVT 5832 ES Mounting Fixture[1] | — |
| Included control PC | Advantest WUN H 3610523 R Control PC[1] | — |
| Included tools | Eclipse XT Teach Tool Kit and Eclipse XT Alignment Tool Kit[1] | — |
| Manufacturer | — | KLA[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
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