Comparison ledger
KLA 1.112 PSL Wafer, KLA FLX 2320 Thin Film Stress Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1.112 PSL Wafer | KLA FLX 2320 |
| Specifications | ||
| Configuration | NIST Traceable[1] | Dual Wavelength[3] |
| Wafer Size | 8 inch[1] | — |
| NIST Traceable | True[1] | — |
| Compatible Tools | Surfscan 6xy0 and Sp1[2] | — |
| Frequency | — | 60 Hz[3] |
| Voltage | — | 115 V[3] |
| Phase | — | 1 Phase[4] |
| OEM | — | KLA[3] |
| Model | — | FLX 2320[3] |
| Tool type | — | Thin Film Stress Measurement System[3] |
| Wavelength mode | — | Dual Wavelength[3] |
| Wafer sizes | — | 8 inch[4] |
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