Comparison ledger
KLA 1007, LTX-Credence Fusion MX, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Fusion MXLTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence Fusion |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | With:[3] |
| 974-0026-02 | — | SBA[3] |
| 974-0122-00 | — | OVI[3] |
| 974-0259-01 | — | HVVI[3] |
| 974-1004-03 | — | DIGHSB[3] |
| 974-1061-01 | — | FX2[3] |
| 974-1108-00 / 974-1110-00 | — | TMBDFX[3] |
| 974-1025-02 | — | VI16B[3] |
| 974-1157-00 | — | SWG[3] |
| Submodules | — | 974-0026-02 SBA, 974-0122-00 OVI, 974-0259-01 HVVI, 974-1004-03 DIGHSB, 974-1061-01 FX2, 974-1108-00 / 974-1110-00 TMBDFX, 974-1025-02 VI16B, 974-1157-00 SWG[3] |
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