Comparison ledger
KLA 1007, Multitest MT 9918, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | MT 9918Multitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest MT 9918 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | MT 9918[3] |
| Description | Wafer Prober[1] | Modular high speed handler[4] |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | Handler[3] |
| Configuration | — | OCTAL A+H BASE 2 IN I[3] |
| Contact sites | — | 4 or 8 asynchronous contact sites[4] |
| Throughput | — | Up to 28,000 uph[4] |
| Package handling | — | SO packages, CSPs, BGAs, QFNs (MLP/MLF), and SOTs[4] |
| Temperature versions | — | Ambient, ambient/hot, or tri-temp[4] |
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