Comparison ledger
KLA 1007, Signatone S-302-4, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | S-302-4Signatone |
|---|---|---|
| OEM | KLA | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | 100mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Signatone S-302-4 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Type | — | Four Point Resistivity Probe Station[3] |
| Probe stand | — | 100 mm[3] |
| Probe head | — | 4 point probe head with 5 mil radius tips of 40 mil spacing[3] |
| Measurement use | — | Sheet resistance and resistivity measurements of substrates and thin films[3] |
| Interfaces with | — | Keithley 2450[3] |
| Probe stand size | — | 100 mm[3] |
| Measurement capabilities | — | Sheet resistance and resistivity measurements of substrates and thin films[3] |
| Interfaces | — | Keithley 2450[3] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →