Comparison ledger
KLA 2367, KLA 2367 Brightfield, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 2367KLA | |
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | Only one wafer size at a time | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 2367 | KLA 2367 |
| Specifications | ||
| SW Version | 10.4.507[1] | — |
| Wafer size | Only one wafer size at a time[1] | — |
| 300 mm (12") | Yaskawa + Asyst ISO Port or[1] | — |
| Configuration | Shinko LP[1] | ORS Upgrade[3] |
| 200 mm (8") | Yaskawa + Asyst Versa Port (SMIF)[1] | — |
| GL | G Line[1] | — |
| IL | I Line[1] | — |
| VIS | Visible[1] | — |
| Equipment type | UV/visible brightfield inspector[2] | — |
| Inspection focus | sensitivity to a broad range of yield-relevant defect types[2] | — |
| Design node | 65nm and above[2] | — |
| Wafer sizes | 8 inch, 12 inch[1] | — |
| Wafer handling | only one wafer size at a time[1] | — |
| Software version | 10.4.507[1] | — |
| Lighting modes | GL: G Line; IL: I Line; VIS: Visible[1] | — |
| Inspection thresholds | 0.12 UV/GL/IL; 0.16 UV/GL/IL; 0.20 UV/GL/IL; 0.25 VIS; 0.39 VIS; 0.62 VIS[1] | — |
| Power Requirements | — | 208 V, 16 A, 50 / 60 Hz, 3 Phase[3] |
| CE Marked | — | Yes[3] |
| OEM | — | KLA[3] |
| Model | — | 2367 Brightfield[3] |
| Category | — | Metrology & Inspection[4] |
| Description | — | brightfield inspection system[4] |
| Wafer support | — | 200 mm cassettes[3] |
| Cassette HW | — | 25 cassette HW 200 mm[3] |
| Model support | — | GEM/SECS and HSMS[3] |
| Pixels enabled | — | .12, .62, .39[3] |
| Vintage | — | 2017[3] |
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