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Tool family

Bruker D 8

BrukerMetrology & Inspection1 entry

Bruker D 8 Diffractometer.

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Models in this family

  1. D 8

    The Bruker D8 is a family of X-ray diffractometers used for structural characterization of crystalline materials, thin films, and powders.

    Cited variants

    DesignationGenerationVintageChangesSource
    D8 Discover——High resolution XRD with heated and cooling stages; ATLAS goniometer, TXS-HE source, Eiger R 250k detector, domed hot stage up to 1100 °C.emsal.nanofab.utah.edu[1]
    D8 Venture——Single-crystal X-ray diffractometer; two microfocus sources (Mo and Cu), kappa four-circle geometry, Photon 100 detector, cooling to 30 K.snsf.stanford.edu[2]
    D8D Plus——High intensity low-divergence collimated X-ray source; ATLAS goniometer; EIGER2 R 500K detector; capable of XRR, GI-SAXS/WAXS, pole figure and residual stress analysis; in situ heating and electrochemical analysis.nanofab.ualberta.ca[3]

Sources

Sources (3)Every fact above is drawn from these public sources
  1. [1]emsal.nanofab.utah.eduemsal.nanofab.utah.edu
  2. [2]snsf.stanford.edusnsf.stanford.edu
  3. [3]nanofab.ualberta.cananofab.ualberta.ca