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Thermo Fisher Scientific FEI Helios NanoLab 400 S FIB-SEM

Thermo FisherMetrology & Inspection1 entry
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Models in this family

  1. Scientific FEI Helios NanoLab 400 S FIB-SEM

    The Thermo Fisher Scientific FEI Helios NanoLab 400 S is a dual-beam focused ion beam and scanning electron microscope (FIB-SEM) system for metrology and inspection.