Advantest
The Advantest 93000 is a tester configured with dedicated EMIG XIMAGE Grabber + DSP, ACDC SD cabinet primary power supply, DCDC cage secondary power supplies, digital boards including C200e and C400e, HVPE high voltage PE, and GPDPS general purpose DPS modules.[1][2]

A test and probe system makes electrical contact to semiconductor devices at wafer level or device level and applies test stimuli while measuring the response.
A system in this class typically combines digital channels, power delivery, and specialized interface hardware so that different device types can be exercised under automated test conditions.
A test and probe system sits in the semiconductor manufacturing flow before final assembly and is used to screen devices at an early stage.
Test and probe systems are used for electrical screening of semiconductor devices during manufacturing.
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
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The Advantest 93000 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing.[2]
The Advantest 93000 is used for electrical screening of semiconductor devices during manufacturing.[2]
The following facts about the 93000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 93000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 93000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 93000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 93000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 93000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 10, 2026.
The Teradyne / Eagle ETS 364 Tester is a semiconductor test system with configurable analog and digital pin units.
The Teradyne iFlex Tester is a configurable test platform with power ratings up to 28.8 kVA at 480 VAC and can be equipped with modules including HSD200, DC30, DC75, BBAC, and VHFAC.
General referenceTeradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.