Applied Materials
SEMVision G 2 CD-SEM
What it is
The Applied Materials SEMVision G 2 is a CD-SEM for metrology and inspection. The tool is a critical dimension scanning electron microscope.[1][3]
Where it fits in the process flow
General reference — not yet source-verifiedA CD-SEM sits in the metrology and inspection flow of semiconductor manufacturing. The tool is used after patterning steps to check feature dimensions and support process control.
Applications
What do the numbers mean?
Wafer handling1
Control & software2
- HDD & Software included[1]
Dimensions & facilities1
Configuration & options7
- With EDX (Energy Dispersive X-ray Spectroscopy)[1]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Hitachi S 8820 CD-SEM— Same function class: Metrology & Inspection, nullCompare in depthsource[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the SEMVision G 2 CD-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the SEMVision G 2 CD-SEM are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the SEMVision G 2 CD-SEM are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the SEMVision G 2 CD-SEM are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the SEMVision G 2 CD-SEM are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the SEMVision G 2 CD-SEM is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 11, 2026.
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