Waferpedia

Filmetrics

F50-UV

F50-UV — uwaterloo.ca
Fig. 01F50-UVuwaterloo.ca[1]

Wafer size

8"

Optics

5 nm – 40 µm[2]

What it is

The Filmetrics F50-UV is a thin-film metrology tool that measures film thickness by spectroscopic reflectometry.[2]

How it works

The Filmetrics F50-UV measures film thickness through the reflectance spectrum of a sample.[1][2]

The Filmetrics F50-UV uses an automated stage to collect thickness uniformity maps.[2]

Where it fits in the process flow

The Filmetrics F50-UV is used after thin-film deposition to check thickness and optical characteristics.[1]

Applications

The Filmetrics F50-UV measures thin-film thickness and optical constants.[1][2]

  • measuring thin film thickness
  • measuring optical characteristics
  • collecting thickness uniformity maps

What do the numbers mean?

Wafer handling2

Substrate size
~5 mm × 5 mm to 200 mm diameter[2]
Accurate?
Wafer handling
Up to 8"[1]
Accurate?

Optics & imaging4

Function
thin-film thickness and optical characteristics measurement[1]
Accurate?
Thickness measurement range
5 nm – 40 µm[2]
Accurate?
Minimum thickness to measure n and k
50 nm[2]
Accurate?
Wavelength range
190–1100 nm[2]
Accurate?

Configuration & options12

Vendor
Filmetrics[1]
Accurate?
Model
Filmetrics F50-UV[1]
Accurate?
Measurement method
spectroscopic reflectometry[2]
Accurate?
Automated stage
yes[1]
Accurate?
Sample size
up to 8 inches in diameter[1]
Accurate?
Spot size
1.5 mm[2]
Accurate?
Light source
deuterium + tungsten-halogen (dual light source; may choose one or both lamps)[2]
Accurate?
Measurement results visualization
2D and 3D[2]
Accurate?
Light source
deuterium + tungsten-halogen (dual light source)[2]
Accurate?
Measurement results visualisation
2D and 3D[2]
Accurate?
Sample stage
Fully automated[1]
Accurate?
Measurement rate
up to 2 points per second[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What does the Filmetrics F50-UV measure?

The Filmetrics F50-UV measures thin-film thickness and optical characteristics.[1][2]

What measurement method does the Filmetrics F50-UV use?

The Filmetrics F50-UV uses spectroscopic reflectometry based on the reflectance spectrum of a sample.[1][2]

Does the Filmetrics F50-UV support mapping?

The Filmetrics F50-UV uses an automated stage to collect thickness uniformity maps.[2]

Not publicly documented

The following facts about the F50-UV are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the F50-UV are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the F50-UV are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the F50-UV are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the F50-UV are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the F50-UV is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]uwaterloo.ca — uwaterloo.cauwaterloo.ca
  2. [2]confluence.nanofab.ualberta.ca — confluence.nanofab.ualberta.caconfluence.nanofab.ualberta.ca
  3. [3]https://www.nanofab.ualberta.ca/category/fabrication/ — nanofab.ualberta.cananofab.ualberta.ca
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Last updated Oct 3, 2026.

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