KLA
The KLA 8935 FFC AOI is an automated optical inspection system for semiconductor wafers, operating on 208 VAC, 50/60 Hz, 3-phase power.[1][2]

Automated optical inspection systems inspect surfaces by using optical imaging and digital image processing to find defects.
Metrology and inspection tools sit in the inspection part of the fab flow and are used to check process results before product moves onward.
Automated optical inspection tools are used to detect defects on patterned surfaces during manufacturing.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the 8935 FFC AOI are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 8935 FFC AOI are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 8935 FFC AOI are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 8935 FFC AOI are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 8935 FFC AOI are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 8935 FFC AOI is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 29, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.