KLA
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The KLA / ICOS CI T 120 is a lead scanner used for inspecting lead frames. The KLA / ICOS CI T 120 operates at 50/60 Hz and consumes 2.07 kW of power.[1]

A lead scanner is a semiconductor inspection instrument used to examine leaded parts or package leads for defects and alignment-related issues. The KLA ICOS CI T 120 belongs to the class of factory metrology and inspection equipment used to verify physical features before later assembly or qualification steps.
The KLA ICOS CI T 120 is specified for 50/60 Hz operation with a power rating of 2.07 kW.[1]
The KLA ICOS CI T 120 fits in inspection and metrology flow where packaged or leaded devices are checked for geometric conformity and visible defects. The tool supports quality control between manufacturing or assembly operations and downstream handling steps.
The KLA ICOS CI T 120 is used for inspection of leaded semiconductor parts and related package features. The lead-scanning role makes the tool relevant to defect screening, dimensional verification, and general physical integrity checks on lead structures.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The KLA ICOS CI T 120 is specified for 50/60 Hz operation.[1]
The following facts about the ICOS CI T 120 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ICOS CI T 120 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ICOS CI T 120 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ICOS CI T 120 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the ICOS CI T 120 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the ICOS CI T 120 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 6, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.