Waferpedia

KLA

P 16 + Profiler

Metrology & InspectionKLA P family
Research Quality: 50% complete

The KLA P-16+ Profiler is a stylus-based surface profiler for step height, roughness, waviness, and stress measurements. The KLA P-16+ Profiler offers a vertical range of 327 µm and supports wafer sizes from 2 to 12 inches.[1][2]

P 16 + Profiler — Inventory photo
Fig. 01P 16 + ProfilerInventory photo[2]

What it is

The KLA P 16 + Profiler is a stylus profilometer used for surface metrology and inspection.[1]

The KLA P 16 + Profiler is a KLA system with wafer sizes from 2 inch to 12 inch.[2]

How it works

The KLA P 16 + Profiler uses precise force control and produces step height, contour, waviness, roughness, and topography measurements.[1]

The KLA P 16 + Profiler has a fully motorized X-Y, Z, theta, and level stage.[2]

Where it fits in the process flow

The KLA P 16 + Profiler supports production and process monitoring.[1]

Applications

The KLA P 16 + Profiler is used for CMP monitoring and bump metrology.[1]

The KLA P 16 + Profiler is used for thin film thickness, roughness, and stress analysis.[1]

The KLA P 16 + Profiler is used for etch rate and trench depth analysis.[1]

What do the numbers mean?

Wafer handling1

Wafer Sizes
2, 3, 4, 5, 6, 8, 12 inch[2]
Accurate?

Control & software2

Software
Profiler V 7.35[2]
Accurate?
Operating System
Windows XP[2]
Accurate?

Configuration & options13

Refurbished[2]
Accurate?
Stress, 3D. GEM / SECS[2]
Accurate?
Stage
Fully Motorized X-Y,Z, Theta, Level Stage[2]
Accurate?
Stylus
2 um / 60D[2]
Accurate?
OS
Windows XP[2]
Accurate?
Vertical Range
327 um[2]
Accurate?
Upgrade to SSD[2]
Accurate?
PDF Manual[2]
Accurate?
Options
Stress, 3D, GEM/SECS[2]
Accurate?
Upgrade to SSD
Yes[2]
Accurate?
PDF Manual
2011 Vintage[2]
Accurate?
Options
Stress, 3D, GEM / SECS, SSD upgrade[2]
Accurate?
Vintage
2011[2]
Accurate?
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What wafer sizes does the KLA P 16 + support?

The KLA P 16 + supports wafer sizes of 2, 3, 4, 5, 6, 8, and 12 inch.[2]

What is the vertical range of the P 16 + stylus profiler?

The vertical range of the P 16 + is 327 micrometers.[2]

What stage and stylus specifications does the P 16 + have?

The P 16 + has a fully motorized X-Y-Z, theta, and level stage, and its stylus has a radius of 2 micrometers with a 60-degree cone angle.[2]

Is the P 16 + suitable for CMP monitoring?

Yes, the P 16 + is used for CMP monitoring and bump metrology applications.[1]

Not publicly documented

The following facts about the P 16 + Profiler are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 16 + Profiler are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the P 16 + Profiler are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the P 16 + Profiler are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the P 16 + Profiler are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the P 16 + Profiler is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]Profilometer P16+ from KLA Tencor — nanoquim.icmab.esnanoquim.icmab.es
  2. [2]Inventory photo
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Last updated Oct 11, 2026.

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