Waferpedia

KLA

P 17 Surface

Metrology & InspectionKLA P family
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The KLA P 17 Surface is a surface profilometer in metrology and inspection. The KLA P 17 Surface uses a stylus profiler for step height and surface roughness measurements. The KLA P 17 Surface supports 2D and 3D measurements.[1][2]

P 17 Surface — Inventory photo
Fig. 01P 17 SurfaceInventory photo[3]

What it is

The KLA P 17 Surface is a surface profilometer in metrology and inspection.[1][3]

How it works

A stylus profiler is used to measure step height and surface roughness, and related measurements can include bow and stress.[2]

Where it fits in the process flow

The P-17 is configured for wafer and sample handling that includes 300 mm wafers and a 240 x 240 mm chuck.[2]

What do the numbers mean?

Power & electrical2

50/60 Hz[3]
Accurate?
Frequency
50/60 Hz[3]
Accurate?

Wafer handling1

Wafer sizes
4 inch, 6 inch, 8 inch, 12 inch[6]
Accurate?

Dimensions & facilities2

Step height measurement range
A few nanometers to 1 millimeter[2]2 sources
Accurate?
Measured quantities
Step height, roughness, bow, stress, defect review[2]
Accurate?

Configuration & options10

Phase
1 Phase[3]
Accurate?
3 Wires[3]
Accurate?
Refurbished[6]
Accurate?
Tool type
Surface profilometer[1]
Accurate?
Tool type
Stylus profiler[2]
Accurate?
Scan length
Up to 200 mm without stitching[2]
Accurate?
Measurement modes
2D and 3D[2]2 sources
Accurate?
Measurement method
Stylus profiler[1]
Accurate?
Power
1 phase[3]
Accurate?
Wires
3 wires[3]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
Tencor P-17 OF——Open Frame version with a bigger frame for larger samples; can be configured for 300 mm wafers or a 240 x 240 mm chuck.kla.com[2]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Configuration50/60 Hz[3]
  • Frequency50/60 Hz[3]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What step height measurement range does the P-17 provide?

The P-17 stylus profilometer measures step heights from a few nanometers to one millimeter.[2]

What scan length can the P-17 achieve without stitching?

The system supports scans up to 200 mm without stitching.[2]

What wafer sizes or sample configurations can the P-17 handle?

The P-17 can be configured for 300 mm wafers, or with a 240 x 240 mm chuck. The P-17 OF (Open Frame) variant provides a larger frame for larger samples.[2]

Not publicly documented

The following facts about the P 17 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 17 Surface are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the P 17 Surface are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the P 17 Surface are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the P 17 Surface is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the P 17 Surface are on record.

    Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (6)Every fact above is drawn from these public sources
  1. [1]waferpedia.com — waferpedia.comwaferpedia.com
  2. [2]kla.com — kla.comkla.com
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]Inventory photo
  6. [6]inventory listing
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Last updated Oct 5, 2026.

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