KLA
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The KLA Surfscan SP 1 DLS Centering Ring is a KLA component for the Surfscan SP 1 DLS system. The KLA Surfscan SP 1 DLS system is an unpatterned surface inspection system. The KLA Surfscan SP 1 DLS system is configured for 200/300mm wafers.[1][2]

The KLA Surfscan SP 1 DLS Centering Ring is a KLA Surfscan SP 1 DLS component.[3][1]
The Surfscan SP 1 DLS is an unpatterned surface inspection system used for wafer inspection and metrology.[2]
The Surfscan SP 1 DLS system uses an argon ion laser at 488 nm, defect maps and histograms, real-time defect classification, and map-to-map comparison.[2]
The Surfscan SP 1 DLS is used for unpatterned surface inspection.[2]
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The Surfscan SP 1 DLS system is an unpatterned surface inspection system used for wafer inspection and metrology.[1]
The Surfscan SP 1 DLS system is configured for 200/300mm wafers.[1][2]
The following facts about the Surfscan SP 1 DLS Centering Ring are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Surfscan SP 1 DLS Centering Ring are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Surfscan SP 1 DLS Centering Ring are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Surfscan SP 1 DLS Centering Ring are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Surfscan SP 1 DLS Centering Ring are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Surfscan SP 1 DLS Centering Ring is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 9, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.