Nikon
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

X-ray inspection systems are used for non-destructive testing and metrology, providing internal imaging of assembled components without physical sectioning. Computed tomography extends this capability to three-dimensional reconstruction, enabling volumetric analysis of internal structures.
An X-ray inspection system generates X-rays from a source that pass through the sample. A detector on the opposite side measures the attenuated radiation to produce a two-dimensional projection image. In computed tomography, the sample is rotated through many angles, and a reconstruction algorithm combines the projections into a three-dimensional volume.
Applications of X-ray inspection include detection of voids in solder joints, verification of wire bond integrity, inspection of flip-chip bumps, and examination of internal features of packaged microelectronics. Computed tomography is applied for detailed characterization of complex assemblies such as multi-die packages, microelectromechanical systems, and advanced interconnect structures.
The unit is a 2012 vintage with a computed tomography (CT) upgrade.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The Nikon XTV 160 is an X-ray inspection system.[1]
The following facts about the XTV 160 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the XTV 160 are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented variants, configuration options, or revision breakpoints of the XTV 160 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the XTV 160 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the XTV 160 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the XTV 160 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 10, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.