C 312 S

The Signatone C 312 S is a manual probe station configured for 12-inch wafers. The C 312 S is a Test & Probe equipment model manufactured by Signatone.^[1][2]

On a probe station, the wafer rests on a chuck that can be moved beneath a set of individually positioned probe tips. The C 312 S is a manual station, so the operator moves the chuck and the manipulators by hand and observes the workspace through a microscope.

Each probe tip is connected by cabling to external measurement instruments, allowing electrical signals to be applied and measured at the device terminals. The chuck and probe tips are arranged to permit low-level electrical measurements on the contacted device.

A probe station such as the C 312 S performs electrical testing after wafer processing is complete and before the wafer is separated into individual chips. On-wafer test data identifies working devices and feeds yield and process-control analysis.

Manual probe stations fit engineering and laboratory workflows in which an operator probes selected devices rather than moving through a full wafer automatically. The C 312 S also belongs to that class of equipment.

Manual probe stations support electrical characterization of semiconductor devices, including measurements of device curves, leakage behavior, and operating parameters. Applications include process development, device debugging, failure analysis, and wafer acceptance testing.