SUSS MicroTec
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

A manual probe station uses a chuck to hold a wafer in place while the operator manually guides probe arms to land on specific die or test sites. The microscope provides optical alignment, and the operator uses micropositioners with fine-thread adjustments to lower probe tips until contact is made. Electrical measurements are then taken through the probes connected to an external instrument such as a parameter analyzer or curve tracer.
Manual probe stations are used in semiconductor fabrication facilities for process development, device characterization, and failure analysis after wafer fabrication is complete. The tool is not part of the front-end manufacturing line but is a test and measurement station located in a laboratory or engineering cleanroom.
Manual probe stations support DC and low-frequency parametric testing of individual devices, such as transistors, diodes, and test structures. Common applications include on-wafer IV curve tracing, threshold voltage measurement, and contact resistance testing. The manual nature of the SUSS P 8 makes it suitable for engineering evaluation, small-batch characterization, and instructional use rather than high-volume production testing.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The following facts about the P 8 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 8 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the P 8 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the P 8 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the P 8 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the P 8 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 5, 2026.