SUSS MicroTec
The SUSS MicroTec PA 300 ProbeShield Probing is a probing station. The SUSS MicroTec PA 300 ProbeShield Probing is configured with a 12-inch nickel plated aluminum chuck. The SUSS MicroTec PA 300 ProbeShield Probing includes an ATT M300 control unit, a Cascade CMPS-888 microscope, and SUSS PH150 micropositioners.[1][2]

The PA 300 ProbeShield Probing belongs in the test and probe stage of semiconductor work, where devices are electrically contacted before final assembly or release.
The PA 300 ProbeShield Probing is used for wafer probing and device-level electrical test work.[1][6]
The PA 300 ProbeShield Probing configuration supports visual inspection and manual probe placement through its microscope and micropositioners.[2][1]
Documented failure modes, common issues, and field considerations.
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
7 parts are EOL or critically scarce: PA 300 Peaking Amplifier; Optional Mounting Kit for Through-Desk Mounting (70-077-02); Extron SYM BNCM Cable (26-533-xx); IEC Power Cord; Rubber Feet (4 pieces); RSB 129 Basic Rack Shelf, 1U 9.5" Deep (60-190-01); RSU 129 Universal Rack Shelf Kit, 1U 9.5" Deep. Source these before taking this tool into production — downtime risk is high.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The PA 300 ProbeShield Probing is a test and probe station for wafer-level electrical probing.[1]
The PA 300 ProbeShield Probing configuration includes a 12-inch nickel plated aluminum chuck, an ATT M300 control unit, a Cascade CMPS-888 microscope, and SUSS PH150 micropositioners.[2][1][6]
The following facts about the PA 300 ProbeShield Probing are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the PA 300 ProbeShield Probing are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the PA 300 ProbeShield Probing are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the PA 300 ProbeShield Probing are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the PA 300 ProbeShield Probing is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the PA 300 ProbeShield Probing are on record.
Answerable by: university cleanroom staff or an OEM application specialist
Last updated Oct 6, 2026.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.