Waferpedia

SUSS MicroTec

SB 6

SB 6 — Inventory photo
Fig. 01SB 6Inventory photo[1]

Wafer size

Wafer bonding at pressures 5e-5 to 3e-3 Torr and 50*C to 550*C

Power

up to 2000 V[2]

Vacuum

5e-5 to 3e-3 Torr[1]

Performance

+/- 5 degrees[2]

What it is

The SUSS MicroTec SB 6 is a semi-automated wafer bonder used for permanently joining two substrates. The system is computer-controlled and operates with a Windows-based environment for recipe management.[1][2][3][4]

How it works

The SB 6 utilizes a robust vacuum chamber that can achieve pressures from 5e-5 to 3e-3 Torr. The system provides independent upper and lower substrate heating over a temperature range of 50 °C to 550 °C, with programmable pressure control up to 20 kN of force. A wafer-stack transfer arm moves the aligned wafer pair into and out of the chamber. For aligned bonding, the SB 6 is used with the SUSS MA6 or BA6 aligner, which positions the substrates before bonding.[1][2][3][4]

During a bonding cycle, the aligned wafer stack is placed between two bond heads. The chamber is evacuated or backfilled with a controlled gas, and the desired temperature and force profiles are applied according to a stored recipe. The bond heads can be exchanged: one head is dedicated to anodic bonding (with a voltage supply up to 2000 V) and another for fusion bonding. The system supports multiple process steps within a single recipe.[2][3]

What do the numbers mean?

Power & electrical2

Supports thermal compression and anodic bonding (up to 2000 V)[1]
Accurate?
Anodic bonding voltage
up to 2000 V[2]2 sources
Accurate?

Vacuum & pumping6

Wafer size
Wafer bonding at pressures 5e-5 to 3e-3 Torr and 50*C to 550*C[1]
Accurate?
Vacuum pressure
5e-5 to 3e-3 Torr[1]
Accurate?
Base pressure
<5x10^-5 mbar[3]
Accurate?
Process pressure range (source 3)
5e-5 to 3e3 mBar[2]
Accurate?
Bonding Pressure Range
5e-5 to 3e-3 Torr[1]
Accurate?
Achievable Chamber Pressure
< 5x10^-5 mbar[3]
Accurate?

Wafer handling4

Forces up to 20 kN for 6" wafers available[1]
Accurate?
Substrate sizes supported
100 mm wafers, 3 inch wafers, small pieces[3]
Accurate?
Substrate sizes supported
150 mm and 200 mm wafers; pieces up to 20 mm x 20 mm[4]
Accurate?
Wafer Size
6 inch (150 mm)[1]
Accurate?

Performance2

Temperature accuracy
+/- 5 degrees[2]
Accurate?
Temperature uniformity
+/- 3%[2]
Accurate?

Control & software2

Computer controlled with Windows environment for saving data / recipes and running multiple recipe steps[1]
Accurate?
Control system
Windows-based computer control[2]
Accurate?

Configuration & options9

Pneumatic Block replaced with a SMC Solenoid Block[1]
Accurate?
Works with the Karl Suss MA6 Aligner for aligned bonding[1]
Accurate?
Temperature range
50°C to 550°C[2]
Accurate?
Temperature range
up to 550°C[3]
Accurate?
Maximum force
20 kN[2]2 sources
Accurate?
Heating
Upper and lower heating[2]
Accurate?
Bond head size
150 mm[3]
Accurate?
Compatible bonding processes
Adhesive, Anodic, Eutectic, Fusion, Glass frit, Thermal compression[3]
Accurate?
Supported Bonding Processes
Adhesive, Anodic, Eutectic, Fusion, Glass frit[3]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
SB6 GEN2GEN2—Second generation with 550°C heating optionuwaterloo.ca[3]
SB6/8e——Semi-automatic wafer bonding system for 150 mm and 200 mm wafersweb.archive.org[4]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Wafer sizeWafer bonding at pressures 5e-5 to 3e-3 Torr and 50*C to 550*C[1]
  • ConfigurationSupports thermal compression and anodic bonding (up to 2000 V)[1]
  • Vacuum pressure5e-5 to 3e-3 Torr[1]
  • Base pressure<5x10^-5 mbar[3]
  • Process pressure range (source 3)5e-5 to 3e3 mBar[2]
  • Anodic bonding voltageup to 2000 V[2]
  • Bonding Pressure Range5e-5 to 3e-3 Torr[1]
  • Achievable Chamber Pressure< 5x10^-5 mbar[3]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What is the difference between permanent and temporary bonding in machines of this class?General reference — not yet source-verified

Permanent bonding, such as fusion or direct bonding, creates a final joint intended to last through the device lifecycle. Temporary bonding uses a removable adhesive layer to mount a device wafer to a carrier, allowing subsequent processing (e.g., thinning, via etching) before the wafer is debonded. Substrate bonders of this class can be configured for either mode by controlling the bonding adhesive, temperature, and force profile.

What types of bonding processes can this class of machine support?General reference — not yet source-verified

The class typically supports thermocompression bonding, adhesive bonding, eutectic bonding, fusion (direct) bonding, and anodic bonding. The specific processes depend on the temperature range, force capacity, vacuum capability, and alignment precision of the machine. Process recipes are user‑programmable to accommodate different materials and bond requirements.

How does alignment accuracy affect the final device performance?General reference — not yet source-verified

Alignment accuracy directly impacts electrical connectivity in stacked devices. In processes such as wafer‑to‑wafer bonding for three‑dimensional interconnects, misalignment can cause shorts, open circuits, or increased resistance. For MEMS capping, poor alignment may compromise hermetic sealing or optical access. Thus, class‑level machines emphasize high‑resolution optical alignment systems and sub‑micron stage repeatability.

What are the typical substrate materials that can be bonded?General reference — not yet source-verified

Common substrate materials include silicon, glass (borosilicate, quartz), compound semiconductors (GaAs, InP), silicon carbide, sapphire, and various dielectrics. Temporary carrier wafers may be made of silicon or specialized glasses. The class can also handle substrates with pre‑existing layers such as metal pads, dielectric coatings, or release layers.

What are the key parameters to control during a bonding process?General reference — not yet source-verified

Critical parameters include bonding temperature and ramp rate, applied force and contact pressure, chamber vacuum or gas atmosphere, surface cleanliness and activation conditions, and alignment offset. Process control ensures uniform bond interface, minimal void formation, and prevention of thermal stress or delamination. Users typically develop recipes that specify the sequence and setpoints for each of these parameters.

Not publicly documented

The following facts about the SB 6 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the SB 6 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the SB 6 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the SB 6 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the SB 6 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the SB 6 are on record.

    Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (5)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]nanolab.ucla.edu — nanolab.ucla.edunanolab.ucla.edu
  3. [3]uwaterloo.ca — uwaterloo.cauwaterloo.ca
  4. [4]web.archive.org — suss.com (Aug 8, 2010)web.archive.org
  5. [5]Tool List - UCSB Nanofab Wiki — wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu
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Last updated Sep 30, 2026.

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