Teradyne
The Teradyne J 750 LitePoint is an RF tester. The J 750 LitePoint is part of the J750 family of test systems.[1][2]
An RF tester is a semiconductor test system used to apply electrical stimulus, measure device response, and sort parts by test results. The J 750 LitePoint belongs to the class of automated test equipment used for production semiconductor testing.
An RF tester typically routes signals through test resources, compares measured behavior against limits, and records pass or fail outcomes for each device under test. A production tester of this class usually combines instrumentation, control software, and interface resources for repeated device insertion and measurement.
The J 750 LitePoint fits in semiconductor test and probe operations. The equipment class is used after wafer fabrication steps that require electrical verification of devices before downstream sorting or assembly.
Probe-based test systems connect to devices through a wafer probe interface during test insertion. The tester measures device behavior at that stage and supports classification of parts for later processing.
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The tester connects to the device through a test head that contains pin electronics. For wafer-level testing, a probe card makes contact with the die; for packaged devices, a test socket is used. The interface allows high-speed signal delivery and accurate measurement.
The typical test flow begins with loading the test program, which defines the stimuli and limits. The DUT is contacted, tests are executed (e.g., functional, parametric, and at-speed tests), and results are logged. Devices that pass proceed to the next process step; failures are binned for analysis or discard.
The main advantages include high test accuracy and repeatability, ability to test complex mixed-signal functionality, high throughput for volume production, and flexible reconfiguration for different device types through software.
The following facts about the J 750 LitePoint are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 LitePoint are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the J 750 LitePoint are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the J 750 LitePoint are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the J 750 LitePoint are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 LitePoint is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 3, 2026.
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