Teradyne
The Teradyne / Nextest Magnum II EV is a self-contained, low-power engineering test system. The Teradyne / Nextest Magnum II EV supports up to 128 digital I/O pins plus an option board (DPS, VRC, or MPAC). The Teradyne / Nextest Magnum II EV runs on standard 110 VAC power (220 VAC in Europe).[1]

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The Teradyne Magnum II EV is a semiconductor test system in the Test & Probe category.[5]
The Teradyne Magnum II EV is used for testing integrated circuits.[5]
The Teradyne Magnum II EV is placed either at wafer probe or at final package test in the semiconductor manufacturing flow.[5]
The following facts about the Magnum II EV are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Magnum II EV are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Magnum II EV are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Magnum II EV are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Magnum II EV is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Magnum II EV are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Sep 25, 2026.
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