Teradyne
MicroFlex
What it is
How it works
The MicroFlex tester executes test vectors to stimulate and measure the electrical response of a device under test. The platform can include high-speed digital (HSD) channels and DC measurement channels. Each HSD channel may include a per-pin measurement unit (PPMU) for parametric current or voltage measurements. The current measurement specification for the PPMU on the Teradyne MicroFlex platform is 2 mA.[8][9][6]
The tester can be used to perform output short-circuit current (IOS) testing by forcing an output pin to 0V and measuring the resulting current. The MicroFlex can test multiple pins in parallel using available tester resources. The platform can also be used to program field-programmable gate arrays (FPGAs) directly by executing a vector rather than using external programming hardware.[8][9]
Where it fits in the process flow
Applications
The Teradyne MicroFlex is applied to the functional and parametric testing of digital and mixed-signal integrated circuits. The platform performs output short-circuit current testing to verify current-limiting protection circuits on device output pins. The MicroFlex can also serve as a device programmer by converting a Serial Vector Format (SVF) file containing a bitstream into a tester vector in order to program FPGAs directly from the tester.[8][9]
The tester is used in semiconductor manufacturing and quality assurance for checking device functionality and parametric performance. The MicroFlex supports applications that require parallel testing of multiple pins simultaneously.[8]
What do the numbers mean?
Power & electrical1
Control & software1
Configuration & options16
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[5]
- LTX-Credence ASL 1000— Same function class: Test & Probe, UnknownCompare in depthsource[5]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[5]
- LTX-Credence ASL 3000— Same function class: Test & Probe, UnknownCompare in depthsource[5]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- 2x HSD20096 Digital Pins (License 100MHz)[4]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the MicroFlex are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MicroFlex are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the MicroFlex are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MicroFlex are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MicroFlex are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MicroFlex is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (10)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]inventory listing
- [6]inventory listing
- [7]Equipment inventory listing
- [8]patents.google.com — patents.google.compatents.google.com
- [9]US11747400B2 - Method of converting a serial vector format (SVF) file to a vector compatible with a semiconductor testing system - Google Patents — patents.google.compatents.google.com
- [10]CN108226746B - Test Method of Transconductance Operational Amplifier MAX436 Based on Micro FLEX - Google Patents — patents.google.compatents.google.com
Last updated Sep 23, 2026.
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The Advantest 93000 Smart Scale Tester is a semiconductor test system that includes a Z640 workstation and can be configured with STH or CTH thermal heads and various card types.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
The LTX / Credence ASL 1000 is an integrated-circuit tester commonly configured with an Electroglas EG 4090 prober for 8-inch wafers.
