Teradyne

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
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The Ultra Flex can test logic, RF, analog, power, mixed-signal, and memory integrated circuits.[14]
Devices tested by the Ultra Flex are used in computing, communications, consumer, automotive, identification, and internet applications.[14]
The Ultra Flex is manufactured by Teradyne, specifically by its Semiconductor Test division.[14]
The following facts about the Ultra Flex are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Ultra Flex are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Ultra Flex are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Ultra Flex are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Ultra Flex are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Ultra Flex is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 26, 2026.
The Advantest 93000 PS 1600 Pin Scale Tester is a semiconductor test system configured with 48 PS1600 channel boards and related DUT interface, RF, DCS-DPS32, and measurement assemblies.
The Advantest C 400 E is a Test & Probe tool documented with a 512-pin configuration and digital and analog setup details.
The Electroglas EG 4090 is an automatic wafer prober designed for high-precision wafer-level electrical testing.