Thermo Fisher
The Scientific FEI Titan 80 300 TEM is a transmission electron microscope. The Titan 80 300 TEM uses a Schottky field emission gun as its electron source. The Titan 80 300 TEM includes a Cs (spherical aberration) image corrector to improve resolution.[1][2]

Power
Alignments at 80kV and 300kV[1]
Performance
Alignments at 80kV and 300kV[1]
Optics
3-Condenser Lens System[1]
The Thermo Fisher Scientific FEI Titan 80 300 TEM is a transmission electron microscope equipped with a Schottky field emission gun, a three-condenser lens system, and a Cs image corrector with its own personal computer and power supply unit.[1][2]
The Titan 80 300 TEM includes a Bruker XFlash EDX detector with a standalone workstation, a Gatan Tridiem GIF for EELS and EFTEM, a Gatan DigiScan, a Gatan ADF/BF STEM detector, and a Fischione HAADF detector.[1][2]
The instrument is fitted with a US1000 bottom-mount CCD camera, a Lorentz lens for Lorentz TEM imaging, and an AAS at the C2 and objective aperture positions, along with manual apertures at the SA, C3, and C1 positions.[1][2]
Transmission electron microscopes are used in semiconductor manufacturing for metrology, defect analysis, and process development, typically in a failure-analysis laboratory or a research environment rather than on the production line.
The Titan 80 300 TEM is employed for high-resolution transmission electron microscopy, scanning TEM, electron diffraction, and tomography, as enabled by its dedicated tomography software and free lens control software.[1][2]
Elemental analysis is performed with the Bruker XFlash EDX detector, and the Gatan Tridiem GIF provides electron energy-loss spectroscopy and energy-filtered TEM capabilities.[1][2]
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The following facts about the Scientific FEI Titan 80 300 TEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
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Last updated Sep 24, 2026.
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