Comparison ledger
Applied Materials 0720 06060 Part, SUSS MicroTec PA 200, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | PA 200SUSS MicroTec |
|---|---|---|
| OEM | Applied Materials | SUSS MicroTec |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | SUSS MicroTec PA 200 |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | 400 VA[2] |
| Voltage | — | 110 V[2] |
| Frequency | — | 60 Hz[2] |
| Power consumption | — | 400 VA[2] |
| Dimensions (H x W x D) | — | 54 in x 32 in x 32 in[3] |
| Weight | — | 163.29 kg[3] |
| Operation type | — | Semi-automatic[3] |
| Country of origin | — | United States[3] |
| Dimensions | — | 54 x 32 x 32 inches[3] |
| Type | — | Prober[2] |
| Operation | — | SemiAutomatic[3] |
| Use | — | Precise semiconductor wafer testing and electrical measurement[3] |
| Power | — | 400 VA[4] |
| Electrical | — | 110 V, 60 Hz[4] |
| Vintage | — | 1997[2] |
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