Waferpedia

Comparison ledger

0720 06060 PartversusJ 750 HD

Applied Materials 0720 06060 Part, Teradyne J 750 HD, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
J 750 HDTeradyne
OEMApplied MaterialsTeradyne
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartTeradyne J 750 HD
Cited variants—
  • Teradyne J 750 HD Tester[1]
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[2]HSD 800 (6)[3]
Type—Tester[3]
Testhead—Included[3]
Computer—Included[3]
Power Conditioner—Included[3]
Manipulator—Not included[3]
HSD 800 modules—6[3]
HDCUB module—1[3]
HDDPS24 modules—4[3]
HDDPS48 module—1[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]inventory listing
  3. [3]inventory listing