Teradyne
J 750 HD
What it is
Where it fits in the process flow
General reference — not yet source-verifiedThe J 750 HD tester is deployed after wafer fabrication to perform electrical testing of integrated circuits. In the wafer sort (probe) step, it contacts each die on the wafer to identify known good die before assembly.
The system is also used in final test, where packaged devices are tested to confirm they meet datasheet specifications before shipment. Both steps are critical for yield management and quality assurance in semiconductor manufacturing.
Applications
General reference — not yet source-verifiedThe J 750 HD is generally used for testing digital and mixed-signal semiconductor devices. Typical device families include microcontrollers, application-specific integrated circuits (ASICs), and system-on-chip (SoC) products.
What do the numbers mean?
Control & software2
- Computer[1]
Configuration & options15
Vintage & configurations
Documented models & variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Teradyne J 750 HD Tester | — | 2014 | Configured with HSD 800 (6), HDCUB, HDDPS24 (4), HDDPS48, testhead, computer, power conditioner, and no manipulator. | Equipment inventory listing[2] |
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
How does this tester connect to the device under test?General reference — not yet source-verified
The system uses a test head that interfaces with the DUT through a socket (for packaged parts) or a probe card (for wafer-level testing). The connection provides signal paths for all device pins.
Is this system suitable for multi-site testing?General reference — not yet source-verified
Yes, such testers are commonly configured for multi-site testing to improve throughput. The architecture supports parallel testing of multiple devices simultaneously.
Can this be used for characterization as well as production testing?General reference — not yet source-verified
Yes, these systems are used for both production testing (high-volume pass/fail) and engineering characterization (detailed parametric analysis) of semiconductor devices.
Not publicly documented
The following facts about the J 750 HD are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 HD are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the J 750 HD are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the J 750 HD are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 HD is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the J 750 HD are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]Equipment inventory listing
Last updated Oct 2, 2026.
