Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Hitachi HF3300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | HF3300Hitachi |
|---|---|---|
| OEM | Applied Materials | Hitachi |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Hitachi HF3300 |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | — |
| Instrument Type | — | Transmission electron microscope (TEM)[2] |
| Instrument Code | — | TEM-14[2] |
| Facility Section | — | Charge Beam Imaging[2] |
| Tool designation | — | Hitachi HF3300(S) Megascope[2] |
| Model | — | HF3300(S)[3] |
| Manufacturer | — | Hitachi[3] |
| Instrument type | — | Transmission electron microscope[4] |
| Mode capability | — | Scanning transmission electron microscopy (STEM)[3] |
| Accelerating voltage | — | 300 kV[3] |
| TEM resolution | — | 0.13 nm[3] |
| STEM resolution | — | 0.1 nm[3] |
| Detectors | — | Annular dark field (ADF) detector and bright field (BF) detector[3] |
| EDS | — | Dual Oxford energy dispersive X-ray spectroscopy detectors[3] |
| EELS | — | Electron energy loss spectroscopy detector[3] |
| Microscopy capabilities | — | High resolution Lorentz microscopy and electron holography[3] |
| In-situ heating | — | Possible with a Norcada heating holder with biasing contacts[3] |
| Gas flow injection | — | Air, O2, H2O vapor, CO2, and H2[3] |
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