Hitachi
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The Hitachi HF3300 is a transmission electron microscope. The Hitachi HF3300 is also capable of scanning transmission electron microscopy. The Hitachi HF3300(S) Megascope is a 300 kV high-resolution analytical transmission electron microscope.[1][2]
Plate 01300 kV in situ SEM/STEM observation of Pt/C catalysts using a Hitachi HF-3300 microscope.
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The TEM resolution is 0.13 nm and the STEM resolution is 0.1 nm.[4]
The following facts about the HF3300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the HF3300 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the HF3300 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the HF3300 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the HF3300 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the HF3300 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 11, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.