Waferpedia

Comparison ledger

GSD 200versus160 XP

Axcelis GSD 200, Varian 160 XP, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
GSD 200Axcelis
160 XPVarian
OEMAxcelisVarian
CategoryIon ImplantationIon Implantation
Wafer sizeIn Air Wafer Handling:—
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAxcelis GSD 200Varian 160 XP
Cited variants—
Specifications
Source HeadEnhanced Source w/ Tantalum[2]—
Extraction90 kV / 90 kV[2]—
Source AnalyzerTriple Indexed Mass Analysis Magnet & Power Supply[2]—
RGA ResolverPort[2]—
RGA ChamberPort[2]—
HYTParticle Detection Monitor[2]—
ConfigurationMER[2]—
Charge ControlE-Shwr IV (Fwd Bias) / P/N: 1183280[2]—
Post Accel ElectP/N: 1182480[2]—
Flag FaradayStandard[2]—
SMIFASYST ARM 2200[2]—
Compressor9600 & 8200[2]—
GeF 4 (High Pressure)Unit MFC[2]—
PH 3(SDS): Unit MFC[2]—
XEUnit MFC ( E Shower not use)[2]—
Argon (High Pressure)Unit MFC[2]—
Wafer Size6 inch (150 mm)[2]—
Extraction Voltage90 kV / 90 kV[2]—
Implant AngleTwo-axis variable (+ / - degrees in both axes)[2]—
Disk Drive TypeRotary[2]—
Cell ControllerCell 133[2]—
Operating SystemSun OS[2]—
ProtocolsSECS-I & SECS II[2]—
InterfaceGM Interface & Ethernet Port[2]—
Wafer sizeIn Air Wafer Handling:[2]—
Dose ControllerReal Time Patented Dose Control[2]—
Configuration (160 XP Ion variant)—150mm High Current IMP[1]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]waferpedia.comwaferpedia.com
  2. [2]inventory listing
  3. [3]Equipment inventory listing